COMPOSITIONS AND METHODS FOR CHEMICAL-MECHANICAL POLISHING OF PHASE CHANGE MATERIALS

专利类型: 
相变材料专利导航
公开(公告)号: 
SG183081A1
申请日: 
2008-07-24
申请局: 
SG
摘要: 
The present invention provides a chemical-mechanical polishing (CMP) composition suitable for polishing a substrate comprising a phase change material (PCM), such as a germanium-antimony-tellurium (GST) alloy. The composition comprises a particulate abrasive material in combination with lysine, an optional oxidizing agent, and an aqueous carrier therefor. CMP methods for polishing a phase change material-containing substrate utilizing the composition are also disclosed.Figure 1
原始专利权人: 
CABOT MICROELECTRONICS CORP
当前专利权人: 
CABOT MICROELECTRONICS CORP